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Comparison of SOS MOSFET's Equivalent Circuit Parameters Extracted From Meter and VNA Measurement

✍ Scribed by Bertling, K.; Rakic, A.D.; Yew Tong Yeow; Brawley, A.; Domyo, H.; Rotella, F.M.

Book ID: 114620756
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 699 KB
Volume: 59
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2170426

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