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Comparison of quantum Hall effect resistance standards of the BNM/LCIE and the BIPM

โœ Scribed by Delahaye, F.; Witt, T.J.; Piquemal, F.; Geneves, G.


Book ID
114543087
Publisher
IEEE
Year
1995
Tongue
English
Weight
420 KB
Volume
44
Category
Article
ISSN
0018-9456

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