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Certification of electrical resistance standards in units of the quantum Hall effect-based ohm

✍ Scribed by V. A. Gusev; T. V. Kozyreva; A. V. Ploshinskii; I. V. Pruss; Yu. P. Semenov; I. V. Khakhamov


Publisher
Springer US
Year
1993
Tongue
English
Weight
121 KB
Volume
36
Category
Article
ISSN
0543-1972

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## Abstract We investigate two features of the transverse resistance __R~xy~__ in a Si‐MOSFET in the quantum Hall effect regime. The first, the β€œovershoot” phenomenon, is observed at filling factor Ξ½ = 3. In this case, when the magnetic field increases and the filling factor Ξ½ approaches Ξ½ = 3, __R