Comparison of N-MOSFET lifetime estimates based on GIDL enhancement and transconductance degradation as criteria : A. B. Joshi and D. L. Kwong. Solid-State Electronics, 35(12), 1757 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 111 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90389-g