Comparison of -MOSFET lifetime estimates based on GIDL enhancement and transconductance degradation as criteria

✍ Scribed by A.B. Joshi; D.L. Kwong

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 361 KB
• Volume: 35
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(92)90257-d