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Comparison of microelectronic test structures for propagation delay measurements

✍ Scribed by D.J. Radacks; C.T. Yao; L.W. Linholm; K.F. Galloway; H.C. Lin

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 471 KB
Volume: 16
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(85)80134-8

No coin nor oath required. For personal study only.

✦ Synopsis

Propagation delay is a parameter which needs to be accurately measured for characterization of VLSI fabrication technologies and VLSI circuit design. In this experiment, three different microelectronic test structures or test circuits were used to measure the propagation delay of a minimally sized CMOS inverter. The measured results and a comparison of the test circuits are presented.

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