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Comparison of Double-Gate MOSFETs and FinFETs with Monte Carlo Simulation

✍ Scribed by Gulzar A. Kathawala; Mohamed Mohamed; Umberto Ravaioli

Book ID
111588881
Publisher
Springer
Year
2003
Tongue
English
Weight
97 KB
Volume
2
Category
Article
ISSN
1569-8025

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πŸ“œ SIMILAR VOLUMES

FinFET and MOSFET preliminary comparison
FinFET and MOSFET preliminary comparison of gate oxide reliability
✍ R. FernΓ‘ndez; R. RodrΓ­guez; M. NafrΓ­a; X. Aymerich; B. Kaczer; G. Groeseneken πŸ“‚ Article πŸ“… 2006 πŸ› Elsevier Science 🌐 English βš– 286 KB

In this work, the influence of gate oxide reliability on N channel FinFET and MOSFET characteristics has been preliminary compared. For similar oxide damage, the results show that the oxide wear out has larger effects on the functionality of the FinFET than on the MOSFET.