## Abstract A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noiseβcorrelation matrix of an elemental section of the device from the device's noise figure, measured for only one sourceβimpedance state at a number of fre
β¦ LIBER β¦
Comparison of calculated noise figures from the parameters of a JFET with measured total noise figures
β Scribed by A. Leupp; M.J.O. Strutt
- Publisher
- Elsevier Science
- Year
- 1967
- Tongue
- English
- Weight
- 122 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0038-1101
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