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Comparative study of deep defects in ZnO microwires, thin films and bulk single crystals

✍ Scribed by Schmidt, F.; Müller, S.; von Wenckstern, H.; Dietrich, C. P.; Heinhold, R.; Kim, H.-S.; Allen, M. W.; Grundmann, M.


Book ID
120647931
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
693 KB
Volume
103
Category
Article
ISSN
0003-6951

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