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Identification of the deep-level defects in AlN single crystals: EPR and TL studies

✍ Scribed by Soltamov, V.A.; Ilyin, I.V.; Soltamova, A.A.; Tolmachev, D.O.; Mokhov, E.N.; Baranov, P.G.

No coin nor oath required. For personal study only.

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