Comparative study of bandwidths in copper delafossites from x-ray emission spectroscopy

✍ Scribed by Shin, D.; Foord, J. S.; Payne, D. J.; Arnold, T.; Aston, D. J.; Egdell, R. G.; Godinho, K. G.; Scanlon, D. O.; Morgan, B. J.; Watson, G. W.; Mugnier, E.; Yaicle, C.; Rougier, A.; Colakerol, L.; Glans, P. A.; Piper, L. F. J.; Smith, K. E.

• Book ID: 125833672
• Publisher: The American Physical Society
• Year: 2009
• Tongue: English
• Weight: 134 KB
• Volume: 80
• Category: Article
• ISSN: 1098-0121
• DOI: 10.1103/PhysRevB.80.233105