Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements

✍ Scribed by Tsormpatzoglou, A.; Hastas, N.A.; Khan, S.; Hatalis, M.; Dimitriadis, C.A.

• Book ID: 114572673
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 231 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2185677