✦ LIBER ✦
Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With $\hbox{Al}_{2}\hbox{O}_{3}$ and $\hbox{Al}_{2}\hbox{O}_{3}/\hbox{SiN}_{x}$ Gate Dielectrics
✍ Scribed by In-tak Cho; Woo-seok Cheong; Chi-sun Hwang; Jeong-min Lee; Hyuck-in Kwon; Jong-ho Lee
- Book ID
- 126607395
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 410 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0741-3106
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