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Comparative measurements of spectral responsivity of silicon photodiodes

✍ Scribed by V. G. Ignat'ev; V. I. Sapritskii; L. E. Svyatova; V. I. Mal'tsev; R. I. Stolyarevskaya; M. N. Pavlovich

Publisher
Springer US
Year
1988
Tongue
English
Weight
243 KB
Volume
31
Category
Article
ISSN
0543-1972

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The absolute diffuse reflectance factors of white ment of a precise absolute reflectance measuring system, various methods for the measurement have been proposed standard reference materials have been measured in d/0 geometry (Sharp-Little method) over the visible spectral since 1920. Only a few met