Rapid absolute diffuse spectral reflectance factor measurements using a silicon-photodiode array
✍ Scribed by Chang-Soon Kim; Hong-Jin Kong
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 99 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0361-2317
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✦ Synopsis
The absolute diffuse reflectance factors of white ment of a precise absolute reflectance measuring system, various methods for the measurement have been proposed standard reference materials have been measured in d/0 geometry (Sharp-Little method) over the visible spectral since 1920. Only a few methods among them have been adopted for primary standard systems in the national stan-range using a silicon-photodiode array. This method reduces the measuring time to a few seconds to obtain dards institutes. Table describes these primary standard systems. Among many kinds of materials that have been complete spectral reflectance factor data from 380-780 nm in the visible range. The effects of the openings and considered for a standard reference material of reflectance, barium sulfate and polytetrafluoroethylene the wall thickness at the sample port onto the spectral reflectance factors were considered to get more accurate (PTFE) have been accepted recently as the most suitable standard materials. 7,8 The properties and reflectance fac-results. The precision of the diffuse reflectance factors in our system was 0.1% in the wavelength region longer tors of these materials can be found in several articles. [5][6][7][8][9][10][11] Table shows the inter-laboratory comparisons of abso-than 550 nm and 0.4% in that shorter than 400 nm. We have obtained the absolute diffuse reflectance factors in lute reflectance scales, to conform the accuracy of the the visible range of two kinds of barium sulfate, and of measurement. 7,12 -14 The geometries of some measuring pressed polytetrafluoroethylene (PTFE) at three different systems are different from others. But the results are coindensities.