Compact Analytical Threshold-Voltage Model of Nanoscale Fully Depleted Strained-Si on Silicon–Germanium-on-Insu lator (SGOI) MOSFETs

✍ Scribed by Vivek Venkataraman; Susheel Nawal; M. Jagadesh Kumar

• Book ID: 114618613
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 365 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.890369