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A simple analytical threshold voltage model of nanoscale single-layer fully depleted strained-silicon-on-insulator MOSFETs

✍ Scribed by Kumar, M.J.; Venkataraman, V.; Nawal, S.


Book ID
114618428
Publisher
IEEE
Year
2006
Tongue
English
Weight
314 KB
Volume
53
Category
Article
ISSN
0018-9383

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