Comments on "Oxide-field dependence of electron injection from silicon into silicon dioxide" [with reply]

✍ Scribed by Fischetti, M.V.; Fiegna, C.; Sangiorgi, E.; Selmi, L.

• Book ID: 114535887
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 434 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.310127