Bias and temperature dependence of homogeneous hot-electron injection from silicon into silicon dioxide at low voltages

✍ Scribed by Fischer, B.; Ghetti, A.; Selmi, L.; Bet, R.; Sangiorgi, E.

• Book ID: 114536748
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 334 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.557776