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Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis

✍ Scribed by Tom Wirtz; Yves Fleming; Urs Gysin; Thilo Glatzel; Urs Wegmann; Ernst Meyer; Urs Maier; Jörg Rychen


Book ID
112206840
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
246 KB
Volume
45
Category
Article
ISSN
0142-2421

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