Combined electron gas SNMS and SIMS instrument for trace and depth profile analysis with high dynamic range

✍ Scribed by R. Jede; K. Seifert; G. Dünnebier

• Book ID: 112323426
• Publisher: Springer
• Year: 1987
• Tongue: English
• Weight: 527 KB
• Volume: 329
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/bf00469121