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Combined resistance and temperature change measurement for the study of electromigration

✍ Scribed by K Sato; C.Y Chang; A Patrinos; R.W Vook; J.A Schwarz

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 166 KB
Volume: 41
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(90)93918-9

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