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Combined optical and electric simulation of metal-semiconductor-metal photodetectors

✍ Scribed by Korner, T.O.

Book ID
114455813
Publisher
The Institution of Electrical Engineers
Year
2000
Tongue
English
Weight
836 KB
Volume
147
Category
Article
ISSN
1350-2433

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📜 SIMILAR VOLUMES

Investigation of the dark electrical cha
Investigation of the dark electrical characteristics of the lateral metal–semiconductor–metal photodetectors using two-dimensional numerical simulation
✍ Nacer Debbar 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 460 KB

## Abstract A detailed investigation of the dark electrical characteristics of the lateral metal–semiconductor–metal (MSM) structures is carried out using a two‐dimensional numerical simulation based on the drift‐diffusion model. The model includes image force barrier lowering and current‐dependent