New spectroscopic ellipsometry techniques are very promising for the non-destructive surface analysis of thin films on metals. Infrared spectroscopic ellipsometry allows the morphological and chemical characterization of these films, and recent results are presented here.
β¦ LIBER β¦
Coilin and coilex: A route for 100 T non-destructive magnets
β Scribed by Salomon Askenazy
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 315 KB
- Volume
- 216
- Category
- Article
- ISSN
- 0921-4526
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