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C–Ni amorphous multilayers studied by atomic force microscopy

✍ Scribed by M Ulmeanu; A Serghei; I.N Mihailescu; P Budau; M Enachescu

Book ID
108416230
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
384 KB
Volume
165
Category
Article
ISSN
0169-4332

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Since its invention twenty years ago the atomic force microscope (AFM) has become one of the most important instruments in colloid and interface science. The ability of tracing force profiles between single particles or particles and flats in liquid environment makes it a tool-of-choice for investig