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CMOS RF Power Amplifier Variability and Reliability Resilient Biasing Design and Analysis

✍ Scribed by Yidong Liu; Jiann-Shiun Yuan

Book ID: 114620309
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 297 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2010.2093141

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