Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests

✍ Scribed by Marwan A. Gharaybeh; Michael L. Bushnell; Vishwani D. Agrawal

• Book ID: 110260763
• Publisher: Springer US
• Year: 1997
• Tongue: English
• Weight: 152 KB
• Volume: 11
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1008247801050