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Circuit for automatic testing of general-purpose ampere voltmeters

✍ Scribed by N. P. Kolev; Zh. I. Kostov; I. A. Kurtev; A. I. Lazarov; E. Kh. Manov; D. S. Rusev; V. D. Filev

Publisher: Springer US
Year: 1976
Tongue: English
Weight: 209 KB
Volume: 19
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf00822677

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## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil