𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Circuit for automatic testing of general-purpose ampere voltmeters

✍ Scribed by N. P. Kolev; Zh. I. Kostov; I. A. Kurtev; A. I. Lazarov; E. Kh. Manov; D. S. Rusev; V. D. Filev


Publisher
Springer US
Year
1976
Tongue
English
Weight
209 KB
Volume
19
Category
Article
ISSN
0543-1972

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Design of testing circuit and test gener
✍ Yukiya Miura; Yasushi Wada; Kozo Kinoshita πŸ“‚ Article πŸ“… 1993 πŸ› John Wiley and Sons 🌐 English βš– 736 KB

## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil