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Chromium oxide film thickness measurements using spontaneous Raman scattering

✍ Scribed by W. A. England; S. N. Jenny; D. A. Greenhalgh

Publisher: John Wiley and Sons
Year: 1984
Tongue: English
Weight: 319 KB
Volume: 15
Category: Article
ISSN: 0377-0486
DOI: 10.1002/jrs.1250150305

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