✦ LIBER ✦
Raman scattering as a technique of measuring film thickness: interference effects in thin growing films: Kevin F McCarty, Appl Optics, 26, 1987, 4482–4486
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 143 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0042-207X
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