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Chi-square Control Charts with Runs Rules

โœ Scribed by Athanasios C. Rakitzis; Demetrios L. Antzoulakos


Publisher
Springer US
Year
2010
Tongue
English
Weight
195 KB
Volume
13
Category
Article
ISSN
1387-5841

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โœ George C. Runger; John W. Fowler ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 258 KB

In semiconductor manufacturing it is useful to design control charts to be sensitive to anticipated assignable causes. Process knowledge can be used to develop summaries for run-to-run control that are more sensitive to problems than traditional approaches. As the number of measurements recorded fro