A computer controlled X-ray diffraction system utilizing position sensitive photon counting techniques that is capable of investigating, in situ, structure at the solid/liquid interface, particularly that between an electrode and an electrolyte solution, is described. The application of this techniq
β¦ LIBER β¦
ChemInform Abstract: X-Ray Probes for in situ Studies of Interfaces
β Scribed by D. D. Fong; C. A. Lucas; M.-I. Richard; M. F. Toney
- Book ID
- 112046110
- Publisher
- John Wiley and Sons
- Year
- 2012
- Weight
- 18 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0931-7597
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