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ChemInform Abstract: UHV Study of Hydrogen Atom Induced Etching of Amorphous Hydrogenated Silicon Thin Films.

✍ Scribed by Thomas Zecho; Birgit D. Brandner; Juergen Biener; Juergen Kueppers


Publisher
John Wiley and Sons
Year
2010
Weight
29 KB
Volume
32
Category
Article
ISSN
0931-7597

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A number of alkylsilanes and alkylcarbosilanes of widely different molecular structure are characterized in terms of their ability to form amorphous hydrogenated silicon-carbon (a-Si:C:H) films in atomic hydrogen-induced chemical vapor deposition (AHCVD). The compounds containing only Si-C and C-H b