Chemical impurities and structural imperfections in semiconductor silicon. Part I : Howard R. Huff. Solid St. Technol., 89 (February 1983)

• Book ID: 107829532
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 134 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90923-x