Chemical impurities and structural imperfections in semiconductor silicon. Part II : Howard R. Huff. Solid St. Technol., 211 (April 1983)

• Book ID: 103279725
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 256 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90789-3