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Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

✍ Scribed by M.C. López; B. Galiana; C. Algora; I. Rey-Stolle; M. Gabas; J.R. Ramos-Barrado


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
204 KB
Volume
253
Category
Article
ISSN
0169-4332

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