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Checkpoints in irredundant two-level combinational circuits

โœ Scribed by Jwu E. Chen; Chung Len Lee; Wen Zen Shen


Publisher
Springer US
Year
1991
Tongue
English
Weight
165 KB
Volume
2
Category
Article
ISSN
0923-8174

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โœฆ Synopsis


It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.


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