Checkpoints in irredundant two-level combinational circuits
โ Scribed by Jwu E. Chen; Chung Len Lee; Wen Zen Shen
- Publisher
- Springer US
- Year
- 1991
- Tongue
- English
- Weight
- 165 KB
- Volume
- 2
- Category
- Article
- ISSN
- 0923-8174
No coin nor oath required. For personal study only.
โฆ Synopsis
It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.
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