Charging effects in silicon nanocrystals within SiO[sub 2] layers, fabricated by chemical vapor deposition, oxidation, and annealing

✍ Scribed by Kouvatsos, D. N.; Ioannou-Sougleridis, V.; Nassiopoulou, A. G.

• Book ID: 120330337
• Publisher: American Institute of Physics
• Year: 2003
• Tongue: English
• Weight: 393 KB
• Volume: 82
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1537869