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Charging effects in Ge nanocrystals embedded in SiO2 matrix for non volatile memory applications

โœ Scribed by M. Kanoun; T. Baron; E. Gautier; A. Souifi


Book ID
108215998
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
157 KB
Volume
26
Category
Article
ISSN
0928-4931

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