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Charge trapping in organic transistor memories: On the role of electrons and holes

✍ Scribed by M. Debucquoy; M. Rockelé; J. Genoe; G.H. Gelinck; P. Heremans

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 571 KB
Volume: 10
Category: Article
ISSN: 1566-1199
DOI: 10.1016/j.orgel.2009.07.005

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