✦ LIBER ✦
Threshold voltage degradation in plasma-damaged CMOS transistors — Role of electron and hole traps related to charging damage
✍ Scribed by Tomasz Brozdotek; Y. David Chan; Chand R. Viswanathani
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 311 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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