Charge-trap memory device fabricated by oxidation of Si1-x Gex

✍ Scribed by Ya-Chin King; Tsu-Jae King; Chenming Hu

• Book ID: 114538623
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 115 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.915694