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Charge transport mechanisms and density of interface traps in MnZnO/p-Si diodes

✍ Scribed by Taşçıoğlu, İlke; Farooq, W.A.; Turan, Raşit; Altındal, Şemsettin; Yakuphanoglu, Fahrettin

Book ID
122192260
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
979 KB
Volume
590
Category
Article
ISSN
0925-8388

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Determination of the interface state den
Determination of the interface state density of the In/p-Si Schottky diode by conductance and capacitance–frequency characteristics
✍ N. Tuğluoğlu; F. Yakuphanoglu; S. Karadeniz 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 339 KB

The electrical characterization of the In/p-Si Schottky diode has been investigated by conductance and capacitance-frequency techniques. The characteristic parameters of the interface states have been determined from the capacitance-frequency and conductance-frequency measurements. The capacitance o