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Charge storage effects in silicon dioxide films : M. Yamin. I.E.E.E. Trans. on Electron Devices, Vol. ED-12, No. 3, 1965, p. 88

Book ID: 113190194
Publisher: Elsevier Science
Year: 1965
Tongue: English
Weight: 100 KB
Volume: 4
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(65)90204-0

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