Charge separation techniques for irradiated pseudo-mos soi transistors

✍ Scribed by Jun, B.; Fleetwood, D.M.; Schrimpf, R.D.; Zhou, X.; Montes, E.J.; Cristoloveanu, S.

• Book ID: 120543283
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 382 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2003.821380