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Charge collection and noise analysis of heavily irradiated silicon detectors

✍ Scribed by Borchi, E.; Bruzzi, M.; Leroy, C.; Pirollo, S.; Sciortino, S.


Book ID
114554891
Publisher
IEEE
Year
1998
Tongue
English
Weight
115 KB
Volume
45
Category
Article
ISSN
0018-9499

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