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Charge buildup effects in asymmetric p-type resonant tunneling diodes

✍ Scribed by Y. Galvão Gobato; M.J.S.P. Brasil; I. Camps; H.B. de Carvalho; L.F. dos Santos; G.E. Marques; M. Henini; L. Eaves; G. Hill

No coin nor oath required. For personal study only.

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