Charge build-up and oxide wear-out during Fowler-Nordheim electron injection in irradiated MOS structures

✍ Scribed by Tomasz Brożek; Andrzej Jakubowski

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 583 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/0026-2692(94)90035-3