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Characterizing the formation and growth of intermetallic compound in the solder joint

โœ Scribed by Y. G. LEE; J. G. DUH


Book ID
111534750
Publisher
Springer
Year
1998
Tongue
English
Weight
309 KB
Volume
33
Category
Article
ISSN
0022-2461

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Polarity effect of electromigration on i
โœ Yu-Dong Lu; Xiao-Qi He; Yun-Fei En; Xin Wang; Zhi-Qiang Zhuang ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 695 KB

The polarity effect of electromigration on the interfacial reactions of micro ball grid array (lBGA) solder joints was studied in terms of microstructural evolution. A dummy lBGA package with the same pair of solder joints was used to obtain reproducible results for a practical application. The lBGA