Use of layered synthetic microstructures
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C. Hombourger; P. Jonnard; J. -M. AndrΓ©; J. -P. Chauvineau
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Article
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1999
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John Wiley and Sons
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English
β 86 KB
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## Measurements of long-wavelength x-rays emitted by light elements can be achieved by using selected layered synthetic microstructures (LSM). For both C Ka and N Ka radiation, W/Si (d = 3.25 nm) LSM was used. Because of the counter efficiency, the C Ka emission has the highest intensity in spite o